The Journal of Industry and Technology

Industrial Analytical Instrumentation

Euro Technology

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JPK reports on the developments of high resolution imaging
in the group of Takeshi Fukuma at Kanazawa University in Japan

Researchers from Kanazawa University in Japan have used the JPK NanoWizard®3 AFM to push the boundaries of high resolution imaging on large objects.

Professor Takeshi Fukuma runs a research group in the Division of Electronic Engineering and Computer Science at Kanazawa University in Japan. The Fukuma Laboratory focuses on molecular-scale analysis and measurements of biological phenomena using atomic force microscopy, AFM.

Picture: Professor Takeshi Fukuma of Kanazawa University in Japanworking with the JPK NanoWizard® AFM system.

Describing his work, Professor Fukuma said "I work on the development of atomic-scale AFM instruments and techniques. While some of the state-of-the-art AFMs exhibit very high spatial resolution, their application range has been limited to simple materials of small sample size. I would like to improve the applicability of the atomic-scale AFM and use it for the practical investigations in broader academic and industrial areas. AFM has a unique capability of atomic-scale resolution imaging even with a simple setup. I want a system that is simple and compact so that it may be expanded easily. This means that in our laboratory-level facility, we can easily modify the setup and explore new possibilities. In addition, nanoscale measurement technique provided by AFM is one of the fundamental research tools. Thus, its improvement may lead to the progress in many research fields. Such a high impact of the technique is one of the reasons for me to work on AFM development."

Continuing, he said, "I chose the NanoWizard® AFM from JPK because it is well designed to be combined with optical microscopes. This combination provides an excellent optical view to align the tip position over a large sample. This capability is very important to achieve our research goal. We wanted to perform high-resolution imaging with JPK's AFM and to obtain this performance even on large samples. For me, the main advantage of the NanoWizard system is the good combination with an inverted optical microscope. Initially, I thought it was important only for biology. But, after I started to use it, I found it is also useful for various other applications. For example, we have used it for estimating the age of rocks by imaging nanoscale cracks created by the decay of uranium. In this application, we needed to have good optical view to align the AFM tip to the surface of a small particle."

For further information about JPK's NanoWizard®3 AFM and applications for the bio & nano sciences, view website: or see more on Facebook: and on You Tube: 

The study of structure and dynamics
of biological membranes using AFM and
advanced fluorescence microscopies in Pierre-Emmanuel Milhiet's group at the CBS in Montpellier

JPK Instruments, reports on how AFM and advanced fluorescence microscopy is being applied in the study of biological membranes in the Centre de Biochimie Structurale (CBS, CNRS and INSERM affiliated) in Montpellier (France).

The CBS includes a research group focused on single molecule physics. Dr Pierre-Emmanuel Milhiet runs a team which applies AFM and advanced fluorescence microscopies (single molecule tracking and single-molecule localization microscopy or SMLM) in the study of both structure and dynamics of biological membranes.

Speaking about his work, Dr Milhiet says "One of our aims is to decipher the molecular mechanisms involved in the lateral segregation of membrane components using artificial bilayers and intact cell membranes. Part of our activities is also to develop new methodologies and we have recently mounted a new setup combining a JPK AFM and home-made SMLM (especially PALM and STORM). The main motivation came from the fact that the lateral resolution that can be achieved with an AFM on intact cells is in the same range than that obtained by SMLM (a few tens of nanometers), making possible the precise identification of structures imaged by the tip. We are also involved in the development of high-speed AFM for imaging biological membranes as part of a collaborative effort with Professor Toshio Ando's group in Japan."

His team uses AFM because it is an outstanding tool to investigate membrane topography. Because of its vertical and lateral resolution, structure of membrane assemblies can be observed and single molecule (protein or DNA) can be delineated by the tip. The possibility to work in liquid is another tremendous advantage as compared to other structural biology techniques.

Dr Milhiet selected the JPK system because "It is a very stable machine for a stand-alone AFM allowing single protein resolution to be achieved on biological membranes. The HyperDrive™ mode is especially suitable for this purpose. Also, JPK's Tip-Assisted Optics stage can be combined with tip scanning which is very useful for compensating the drift of the sample stage which may be observed during long-term SMLM acquisition. Combining single molecule fluorescence microscopies with AFM is important as it enables us to understand that the integration of multiple methodologies over multiple length- and time-scales, from molecular to cellular levels, is necessary to tackle complex biological questions."

For further information, view website: Facebook: You Tube: 

Fast-scanning & super-resolution NanoWizard ULTRA Speed AFM system

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the release of the next generation of NanoWizard® AFM systems delivering fast-scanning and super-resolution on an inverted microscope.

The boundaries for performance of analytical instrumentation are continually being pushed to the limits. In the world of atomic force microscopy, AFM, JPK Instruments have launched a new AFM system capable of delivering fast-scanning and super-resolution on a single instrument platform, the NanoWizard® ULTRA Speed AFM. The fast scanning NanoWizard® ULTRA Speed AFM is important to users as it enables the tracking of changes in samples in real time whether the sample be imaged in air or liquid. Scanning at speeds of greater than 100Hz line rate with excellent, true atomic resolution in closed-loop mode is enabled by the enhanced low noise of scanner, position sensor and detection system. The new AFM system uses JPK's unique QI™ (Quantitative Imaging) mode to provide quantitative material property mapping.

Picture: JPK's new NanoWizard® ULTRA Speed AFM mounted on a Zeiss Axiovert microscope.

As with previous NanoWizard® systems, the ULTRA Speed AFM may be fully integrated with an inverted optical microscope thanks to its tip-scanning design and DirectOverlay™ mode for the most precise correlative microscopy. Similarly, the system provides extensive force measurement capability making measurements on single molecules or on living cells thanks to the JPK RampDesigner™ and ExperimentPlanner™. The system is fully compatible with JPK's unsurpassed range of imaging modes and accessories especially for environmental control of the sample.

Speaking about the announcement of the NanoWizard® ULTRA Speed AFM, founder and Chief Technical Officer, Torsten Jähnke, says that "Once again JPK have set a new standard in terms of resolution paired with scan speed. We have managed to develop the lowest noise cantilever deflection system which, when put with our latest fast, high bandwidth electronics, is able to deliver the most accurate force control system even on the most delicate of samples, perfect for users studying biological or other soft matter systems. It is the best multipurpose, fast and high-resolution machine on an inverted microscope today."

For further information, view website: 
Refer to page 62

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